Country for PR: United Kingdom
Contributor: PR Newswire Europe
Wednesday, February 12 2020 - 12:00
AsiaNet
ATP I-Temp NVMe SSDs Combine High Performance 8-Channel PCIe Gen 3 x4, End-to-End Data Protection, MCU-Based Power Management
TAIPEI, Taiwan, February 12, 2019, /PRNewswire-AsiaNet/--

ATP Electronics, the leading manufacturer of industrial-only memory and storage 
solutions, combines the speed and performance of PCIe NVMe with the reliability 
and endurance features of 3D NAND flash, the high capacity of triple level 
flash (TLC), high-performance 8-channel controllers, end-to-end data 
protection, breakthrough power management and power loss protection (PLP) 
technology to deliver its next-generation M.2 2280 NVMe N600Si/N600Sc solid 
state modules.

"NVMe and 3D NAND are among the most disruptive technologies we have seen in 
recent years. ATP leverages these along with our superior hardware, firmware 
and testing capabilities to offer blazing-fast SSDs that deliver new levels of 
performance, reliability and endurance," said Marco Mezger, ATP Vice President 
of Global Marketing. "As the first to introduce I-Temp M.2 NVMe SSDs two years 
ago, ATP continues to meet the rigid storage requirements of industrial 
applications with uncompromising reliability and long service life to make sure 
that our customers get the most value out of their total cost of ownership 
(TCO)."

Overview
- Available capacities: 120/240/480/960/1920 GB 
- Sequential read/write performance: 3,420/3,050 MB/s max. 
- Endurance: Up to 5,120 TB 
- Available in I-Temp (N600Si) and C-Temp (N600Sc) ratings 
- End-to-end data protection and RAID support

8-channel NAND Performance

The ATP N600Si/N600Sc M.2 NVMe 2280 SSDs feature 8 Gb/s PCIe Gen3 x4 lanes of 
simultaneous data flow with eight NAND channels. This design optimizes both 
hardware and software to take full advantage of PCIe 3.1 and NVMe 1.3 SSD 
specifications, addressing diverse industries' need for fast and reliable 
storage.

Comprehensive Data Protection

End-to-end data path protection and SRAM error correcting code (ECC) provide 
error control throughout the entire data transfer path from the host system to 
the SSD and vice versa, thus ensuring data integrity and reliable data 
transfers.

MCU-based PLP Design

Providing an extra layer of reliability is a unique power management and power 
loss protection (PLP) mechanism based on a microcontroller (MCU) design. 
Integrated into ATP's 4th Generation PLP, PowerProtector 4, the MCU design 
improves device protection and data integrity when power failures, glitches and 
power current challenges occur.

ATP PowerProtector 4 combines hardware and firmware solutions to protect both 
data and storage device, such as power-up inrush current suppression and input 
over-voltage protection. For better data integrity, the input power noise 
de-glitch prevents incorrect cache flushing caused by false triggers such as 
noisy or unstable host input voltage. With customization options available, the 
new MCU-based design allows PLP capabilities to be tailor-fitted according to 
unique customer requirements, application-specific needs, or use cases.

LDPC+RAID Engine Support 

ATP N600Si/N600Sc NVMe SSDs leverage a proprietary 2 KB codeword Low-Density 
Parity-Check (LDPC) ECC with an embedded programmable RAID engine that enhances 
the endurance and data retention of 3D TLC NAND. RAID support ensures 
redundancy and fault tolerance to prevent data loss in the event of a drive 
failure.

For inquiries, please contact ATP regional sales, distributors, or send an 
email to Info@atpinc.com. 

Follow ATP Electronics on LinkedIn: 
https://www.linkedin.com/company/atp-electronics

For more information on the product, visit: http://bit.ly/2UtHBiO

About ATP

ATP Electronics is the leading provider of "Industrial Only" NAND flash 
products and DRAM modules for demanding industrial/automotive applications 
requiring the highest levels of performance, reliability and endurance. A true 
manufacturer for over 25 years, ATP manages every stage of the manufacturing 
process to ensure quality and product longevity, offering in-house design, 
testing, and tuning from component to product level. For more information on 
ATP Electronics, please visit www.atpinc.com or contact us at info@atpinc.com.

(Picture http://www.apimages.com)

Media Contact: 
Kelly Lin,  
+886-2-2659-6368 353
Kellylin@tw.atpinc.com

SOURCE: ATP Electronics
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