Chroma ATE launches complete test solutions for True Wireless Stereo (TWS) 
chips, incorporating wireless RF and MCU tests as well as digital, analog, and 
mixed-signal measurements. The economical Chroma 3380 test systems satisfy 
price-conscious IC designers, whereas the advanced Chroma 3680 test systems 
provide fast and comprehensive testing to fulfill innovative and 
high-sensitivity TWS chip testing needs.

Chips used by TWS have become more and more widely used in recent years. Were 
they just installed in earphones and handling simple ICs for Bluetooth and 
audio signal in the early years, TWS chips nowadays are applied to smart 
speakers, wireless speakers, and even wearable devices. Likewise, the testing 
of TWS chips has extended from purely wireless Bluetooth, digital, and signal 
tests to power supply, memory, sensor, and more.

Chroma ATE semiconductor test solutions have long been recognized by the 
industry for their high degree of software and hardware integration as well as 
their high quality digital and analog semiconductor tests at reasonable prices. 
Moreover, the Chroma 3380 series holds a leading position in the Chinese MCU 
testing market. The Chroma 3380 series also provides comprehensive Bluetooth RF 
tests, with built-in functionality that supplies more than 90dB signal-to-noise 
ratio in audio testing to complete all test requirements at one stop. For 
premium and high-sensitivity products, the Chroma 3680 series performs 
high-speed signal tests and provides voltage and current measurements with high 
precision. Its mixed-signal measurement subsystem supports a signal-to-noise 
ratio over 110dB. The specially designed quick dock/release RF signal 
connection interface equips Chroma 3680 with high stability when testing 
high-end TWS products.

SOURCE:  Chroma ATE Inc.

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